Authors: BUGAJSKI M EDELMAN P ORNOCH J WESOLOWSKI M LEWANDOWSKI W KUCHARSKI K

Citation: M. Bugajski et al., WHOLE WAFER ASSESSMENT OF ELECTRONIC MATERIALS BY SCANNING PHOTOLUMINESCENCE AND SURFACE PHOTOVOLTAGE, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 186-189