Authors: LOMOV AA OSIPOV AF SIROCHENKO VP

Citation: Aa. Lomov et al., A PROCEDURE FOR INVESTIGATING THE NEAR-SURFACE LAYERS OF SILICON SINGLE-CRYSTALS BY THE METHOD OF 3-CRYTSTAL X-RAY-DIFFRACTOMETRY, Industrial laboratory, 59(2), 1993, pp. 173-177

Authors: GESHELIN VG OSIPOV AF

Citation: Vg. Geshelin et Af. Osipov, METHOD AND INSTALLATION FOR DETERMINING THE FATIGUE LIMIT OF METAL SHEET, Industrial laboratory, 59(11), 1993, pp. 1053-1056

Authors: GESHELIN VG OSIPOV AF URUSOV YA

Citation: Vg. Geshelin et al., METHODOLOGY AND DEVICE FOR DETERMINING THE MECHANICAL-PROPERTIES OF THIN SHEET-METAL, Industrial laboratory, 59(1), 1993, pp. 81-83