Authors: SEIDLER W WALTER D FLORIAN J HARPER H LUTJENS S SALAZAR M ALEXANDER D SMITH A HEIDEMAN B SELF T FERGUSON G OVREBO G BLOMQUIST S BLACKBURN J VANDERWALL J

Citation: W. Seidler et al., TEMPERATURE-DEPENDENT DOSE-RATE EFFECTS IN CMOS SOS DEVICES, IEEE transactions on nuclear science, 41(5), 1994, pp. 1770-1779