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Results:
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Results: 2
Analysis of III-V layer stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range
Authors:
Bukkems, HG Oei, YS Richter, U Gruska, B
Citation:
Hg. Bukkems et al., Analysis of III-V layer stacks on INP substrates using spectroscopic ellipsometry in the NIR spectral range, THIN SOL FI, 364(1-2), 2000, pp. 165-170
Polarization independent dilated WDM cross-connect on InP
Authors:
Herben, CGP Maat, DHP Leijtens, XJM Leys, MR Oei, YS Smit, MK
Citation:
Cgp. Herben et al., Polarization independent dilated WDM cross-connect on InP, IEEE PHOTON, 11(12), 1999, pp. 1599-1601
Risultati:
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