AAAAAA
Results:
1-11
|
Results: 11
Authors:
Morais, J
Oelsner, A
Schonhense, G
Fecher, GH
Landers, R
de Siervo, A
Kleiman, GG
Citation: J. Morais et al., Photoemission from Pt(111)-(hex)-Rb and Pt(111)-(4x1)-RbO using polarised synchrotron radiation, J ELEC SPEC, 114, 2001, pp. 345-350
Authors:
Fecher, GH
Schmied, B
Oelsner, A
Schonhense, G
Citation: Gh. Fecher et al., Temperature-dependent angular resolved UV-photoemission spectroscopy from CeNi2Ge2, J ELEC SPEC, 114, 2001, pp. 747-752
Authors:
Fecher, GH
Morais, J
Liesegang, J
Braun, J
Cherepkov, NA
Oelsner, A
Gunther, M
Schicketanz, M
Schonhense, G
Citation: Gh. Fecher et al., Spin polarisation and dichroism in ARUPS from thin rare earth films, J ELEC SPEC, 114, 2001, pp. 1171-1177
Authors:
Schneider, CM
de Haas, O
Muschiol, U
Cramer, N
Oelsner, A
Klais, M
Schmidt, O
Fecher, GH
Jark, W
Schonhense, G
Citation: Cm. Schneider et al., Photoemission microscopy from magnetically coupled thin-film systems, J MAGN MAGN, 233(1-2), 2001, pp. 14-20
Authors:
Schicketanz, M
Oelsner, A
Morais, J
Mergel, V
Schmidt-Bocking, H
Schonhense, G
Citation: M. Schicketanz et al., Electron-TOF-analyser for complete momentum analysis in photoemission fromsurfaces, NUCL INST A, 467, 2001, pp. 1519-1522
Authors:
Schonhense, G
Oelsner, A
Schmidt, O
Fecher, GH
Mergel, V
Jagutzki, O
Schmidt-Bocking, H
Citation: G. Schonhense et al., Time-of-flight photoemission electron microscopy - a new way to chemical surface analysis, SURF SCI, 480(3), 2001, pp. 180-187
Authors:
Merkel, M
Escher, M
Settemeyer, J
Funnemann, D
Oelsner, A
Ziethen, C
Schmidt, O
Klais, M
Schonhense, G
Citation: M. Merkel et al., Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter, SURF SCI, 480(3), 2001, pp. 196-202
Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy
Authors:
Oelsner, A
Schmidt, O
Schicketanz, M
Klais, M
Schonhense, G
Mergel, V
Jagutzki, O
Schmidt-Bocking, H
Citation: A. Oelsner et al., Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy, REV SCI INS, 72(10), 2001, pp. 3968-3974
Authors:
Fecher, GH
Braun, J
Cherepkov, NA
Chernysheva, LV
Jentzsch, T
Morais, J
Oelsner, A
Ostertag, C
Paul, J
Ufer, H
Schonhense, G
Citation: Gh. Fecher et al., Dichroism in angular resolved VUV-photoemission from the (0001) surfaces of thin Gd and Nd films epitaxially grown on W(110), EUR PHY J B, 11(1), 1999, pp. 161-175
Authors:
Oelsner, A
Fecher, GH
Citation: A. Oelsner et Gh. Fecher, Photoelectron-holography using circularly polarized light, J ELEC SPEC, 103, 1999, pp. 455-461
Authors:
Oelsner, A
Fecher, GH
Schicketanz, M
Schonhense, G
Citation: A. Oelsner et al., Determining the optical properties of adsorbate covered surfaces by dichroism in VUV-photoemission, SURF SCI, 435, 1999, pp. 53-57
Risultati:
1-11
|