Authors: Milanowski, RJ Pagey, MP Massengill, LW Schrimpf, RD Wood, ME Offord, BW Graves, RJ Galloway, KF Nicklaw, CJ Kelley, EP

Citation: Rj. Milanowski et al., TCAD-assisted analysis of back-channel leakage in irradiated mesa SOI nMOSFETs, IEEE NUCL S, 45(6), 1998, pp. 2593-2599