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Results:
1-8
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Results: 8
Authors:
Dessie, T
Ogle, B
Citation: T. Dessie et B. Ogle, Village poultry production systems in the central highlands of Ethiopia, TROP ANIM, 33(6), 2001, pp. 521-537
Authors:
Manion, CV
Howard, J
Ogle, B
Parkhurst, J
Edmundson, A
Citation: Cv. Manion et al., Aspartame effect in sickle cell anemia, CLIN PHARM, 69(5), 2001, pp. 346-355
Authors:
Phuc, BHN
Ogle, B
Lindberg, JE
Citation: Bhn. Phuc et al., Effect of replacing soybean protein with cassava leaf protein in cassava root meal based diets for growing pigs on digestibility and N retention, ANIM FEED S, 83(3-4), 2000, pp. 223-235
Authors:
Houssa, M
Mertens, PW
Heyns, MM
Jeon, JS
Halliyal, A
Ogle, B
Citation: M. Houssa et al., Soft breakdown in very thin Ta2O5 gate dielectric layers, SOL ST ELEC, 44(3), 2000, pp. 521-525
Authors:
Ahmed, K
Ibok, E
Bains, G
Chi, D
Ogle, B
Wortman, JJ
Hauser, JR
Citation: K. Ahmed et al., Comparative physical and electrical metrology of ultrathin oxides in the 6to 1.5 nm regime, IEEE DEVICE, 47(7), 2000, pp. 1349-1354
Authors:
Ibok, E
Ahmed, K
Hao, MY
Ogle, B
Wortman, JJ
Hauser, JR
Citation: E. Ibok et al., Gate quality ultrathin (2.5 nm) PECVD deposited oxynitride and nitrided oxide dielectrics, IEEE ELEC D, 20(9), 1999, pp. 442-444
Authors:
Houssa, M
Degraeve, R
Mertens, PW
Heyns, MM
Jeon, JS
Halliyal, A
Ogle, B
Citation: M. Houssa et al., Electrical properties of thin SiON/Ta2O5 gate dielectric stacks, J APPL PHYS, 86(11), 1999, pp. 6462-6467
Authors:
Ahmed, K
Ibok, E
Yeap, GCF
Xiang, Q
Ogle, B
Wortman, JJ
Hauser, JR
Citation: K. Ahmed et al., Impact of tunnel currents and channel resistance on the characterization of channel inversion layer charge and polysilicon-gate depletion of sub-20-angstrom gate oxide MOSFET's, IEEE DEVICE, 46(8), 1999, pp. 1650-1655
Risultati:
1-8
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