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Results: 1-8 |
Results: 8

Authors: Schmidt, A Bruck, R Hahn, K Labeque, A Popovic, G Ohler, M Riedel, H Rizvi, N Stange, T
Citation: A. Schmidt et al., TRANSTEC - A new tool for online educational multimedia training on innovative high aspect ratio microtechnologies, MICROSYST T, 6(3), 2000, pp. 109-112

Authors: Nielsen, SF Wolf, A Poulsen, HF Ohler, M Lienert, U Owen, RA
Citation: Sf. Nielsen et al., A conical slit for three-dimensional XRD mapping, J SYNCHROTR, 7, 2000, pp. 103-109

Authors: Wilkins, SB Hatton, PD Liss, KD Ohler, M Katsufuji, T Cheong, SW
Citation: Sb. Wilkins et al., High-resolution high energy X-ray diffraction studies of charge ordering in CMR manganites and nickelates, INT J MOD B, 14(29-31), 2000, pp. 3753-3758

Authors: Ohler, M del Rio, MS Tuffanelli, A Gambaccini, M Taibi, A Fantini, A Pareschi, G
Citation: M. Ohler et al., X-ray topographic determination of the granular structure in a graphite mosaic crystal: a three-dimensional reconstruction, J APPL CRYS, 33, 2000, pp. 1023-1030

Authors: Argunova, TS Vitman, RF Grekhov, IV Kostina, LS Kudryavtseva, TV Gutkin, MY Shturbin, AV Hartwig, J Ohler, M Kim, ED Kim, SC
Citation: Ts. Argunova et al., Reduction of elastic strains in directly-bonded silicon structures, PHYS SOL ST, 41(11), 1999, pp. 1790-1798

Authors: Ohler, M Hartwig, J
Citation: M. Ohler et J. Hartwig, Theory of moire fringes on X-ray diffraction topographs of bicrystals, ACT CRYST A, 55, 1999, pp. 413-422

Authors: Ohler, M Kohler, S Hartwig, J
Citation: M. Ohler et al., X-ray diffraction moire topography as a means to reconstruct relative displacement fields in weakly deformed bicrystals, ACT CRYST A, 55, 1999, pp. 423-432

Authors: Ohler, M
Citation: M. Ohler, The expectation of Elijah and the presence of the Kingdom of God (Identifying a 1st-century-CE neotestamental eschatological connection), J BIBL LIT, 118(3), 1999, pp. 461-476
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