Authors: Ohser, J

Citation: J. Ohser, Statistical analysis of microstructures - A review of new developments, PRAKT METAL, 38(3), 2001, pp. 151-168

Authors: Lang, C Ohser, J Hilfer, R

Citation: C. Lang et al., On the analysis of spatial binary images, J MICROSC O, 203, 2001, pp. 303-313

Authors: Nagel, W Ohser, J Pischang, K

Citation: W. Nagel et al., An integral-geometric approach for the Euler-Poincare characteristic of spatial images, J MICROSC O, 198, 2000, pp. 54-62

Authors: Benes, V Rataj, J Krejcir, P Ohser, J

Citation: V. Benes et al., Projection measures and estimation variances of intensities, STATISTICS, 32(4), 1999, pp. 369-393

Authors: Mucklich, F Ohser, J Blank, S Katrakova, D Petzow, G

Citation: F. Mucklich et al., Stereological analysis of grain size and grain shape applied to silicon nitride ceramics, Z METALLKUN, 90(8), 1999, pp. 557-561

Authors: Nippe, M Ohser, J

Citation: M. Nippe et J. Ohser, The stereological unfolding problem for systems of homothetic particles, PATT RECOG, 32(9), 1999, pp. 1649-1655