Authors:
Washio, K
Kondo, M
Ohue, E
Oda, K
Hayami, R
Tanabe, M
Shimamoto, H
Harada, T
Citation: K. Washio et al., A 0.2-mu m self-aligned selective-epitaxial-growth SiGeHBT featuring 107-GHz f(max) and 6.7-ps ECL, IEEE DEVICE, 48(9), 2001, pp. 1989-1994
Authors:
Washio, K
Ohue, E
Oda, K
Hayami, R
Tanabe, M
Shimamoto, H
Citation: K. Washio et al., A 50-GHz static frequency divider and 40-Gb/s MUX/DEMUX using self-alignedselective-epitaxial-growth SiGeHBTs with 8-ps ECE, IEEE DEVICE, 48(7), 2001, pp. 1482-1487
Authors:
Shimamoto, H
Onai, T
Ohue, E
Tanabe, M
Washio, K
Citation: H. Shimamoto et al., High-frequency, low-noise Si bipolar transistor fabricated using self-aligned metal/IDP technology, IEICE TR EL, E82C(11), 1999, pp. 2007-2012
Authors:
Washio, K
Ohue, E
Oda, K
Tanabe, M
Shimamoto, H
Onai, T
Kondo, M
Citation: K. Washio et al., A selective-epitaxial-growth SiGe-base HBT with SMI electrodes featuring 9.3-ps ECL-gate delay, IEEE DEVICE, 46(7), 1999, pp. 1411-1416
Citation: K. Ohhata et al., Design of a 32.7-GHz bandwidth AGC amplifier IC with wide dynamic range implemented in SiGeHBT, IEEE J SOLI, 34(9), 1999, pp. 1290-1297