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Authors: Chen, YJ Yee, D Dains, K Chatterjee, A Cavalcoli, J Schneider, E Om, J Woychik, RP Magnuson, T
Citation: Yj. Chen et al., Genotype-based screen for ENU-induced mutations in mouse embryonic stem cells, NAT GENET, 24(3), 2000, pp. 314-317

Authors: Lee, B Kim, S Kim, J Om, J
Citation: B. Lee et al., The influence of post annealing on oxide charge-to-breakdown in tungsten polycide gate technology, SOL ST ELEC, 44(1), 2000, pp. 189-192

Authors: Kim, T Kim, J Om, J
Citation: T. Kim et al., A novel shallow trench isolation technology to control inverse narrow width effect on CMOS transistors, J KOR PHYS, 35, 1999, pp. S861-S864
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