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Fera, A
Opitz, R
de Jeu, WH
Ostrovskii, BI
Schlauf, D
Bahr, C
Citation: A. Fera et al., Structure of freely suspended chiral smectic films as determined by x-ray reflectivity and optical ellipsometry - art. no. 021702, PHYS REV E, 6402(2), 2001, pp. 1702
Authors:
Fera, A
Dolbnya, IP
Opitz, R
Ostrovskii, BI
de Jeu, WH
Citation: A. Fera et al., Crystalline smectic-B films as fluctuating systems: Static and dynamic x-ray scattering - art. no. 020601, PHYS REV E, 6302(2), 2001, pp. 0601
Authors:
Nieuwhof, RP
Kimkes, P
Marcelis, ATM
Sudholter, EJR
Opitz, R
de Jeu, WH
Citation: Rp. Nieuwhof et al., Langmuir and Langmuir-Blodgett films of side chain liquid-crystalline poly(maleic acid-alt-1-alkene)s, LANGMUIR, 17(1), 2001, pp. 78-85
Authors:
Schmidbauer, M
Opitz, R
Wiebach, T
Kohler, R
Citation: M. Schmidbauer et al., Inclined inheritance of interface roughness in semiconductor superlatticesas characterized by x-ray reciprocal space mapping - art. no. 195316, PHYS REV B, 6419(19), 2001, pp. 5316
Authors:
Sentenac, D
Fera, A
Opitz, R
Ostrovskii, BI
Bunk, O
de Jeu, WH
Citation: D. Sentenac et al., X-ray scattering from freely suspended smectic films: resolution and othereffects, PHYSICA B, 283(1-3), 2000, pp. 232-236
Authors:
Mogilyanski, D
Gartstein, E
Blumin, M
Fekete, D
Opitz, R
Kohler, R
Citation: D. Mogilyanski et al., Investigation of the interface roughness in a LPOMVPE grown AlAs GaAs multilayer, J PHYS D, 32(10A), 1999, pp. A239-A244