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Results: 1
Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's
Authors:
Ahmed, K De, I Osburn, C Wortman, J Hauser, J
Citation:
K. Ahmed et al., Limitations of the modified shift-and-ratio technique for extraction of the bias dependence of L-eff and R-sd of LDD MOSFET's, IEEE DEVICE, 47(4), 2000, pp. 891-895
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