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Results: 4
RECOMBINATION-ENHANCED ANNEALING IN GAAS AND ALGAAS LAYERS
Authors:
SOBOLEV MM ABRAMOV AV DERYAGIN NG DERYAGIN AG KUCHINSKII VI PAPENTSEV MI
Citation:
Mm. Sobolev et al., RECOMBINATION-ENHANCED ANNEALING IN GAAS AND ALGAAS LAYERS, Semiconductors, 30(6), 1996, pp. 587-590
METASTABLE DEFECTS IN AS-GROWN AND ELECTRON-IRRADIATED AL0.3GA0.7AS
Authors:
SOBOLEV MM KOCHNEV IV PAPENTSEV MI KALINOVSKY VS
Citation:
Mm. Sobolev et al., METASTABLE DEFECTS IN AS-GROWN AND ELECTRON-IRRADIATED AL0.3GA0.7AS, Semiconductor science and technology, 11(11), 1996, pp. 1692-1695
NEW BISTABLE DEFECT WITH DEEP LEVELS IN SI-DOPED ALXGA1-XAS
Authors:
SOBOLEV MM KOCHNEV IV PAPENTSEV MI
Citation:
Mm. Sobolev et al., NEW BISTABLE DEFECT WITH DEEP LEVELS IN SI-DOPED ALXGA1-XAS, Semiconductors, 28(4), 1994, pp. 397-400
DEGRADATION MECHANISM OF GAAS ALGAAS QUANTUM-WELL LASER (VOL 26, PG 985, 1992)/
Authors:
SOBOLEV MM GITTSOVICH AV PAPENTSEV MI KOCHNEV IV YAVICH BS
Citation:
Mm. Sobolev et al., DEGRADATION MECHANISM OF GAAS ALGAAS QUANTUM-WELL LASER (VOL 26, PG 985, 1992)/, Semiconductors, 27(1), 1993, pp. 106-106
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