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Results: 1-10 |
Results: 10
POTENTIALITIES OF X-RAY-DIFFRACTOMETRY FOR STUDYING DELTA-LAYERS ON EXAMPLE OF THE AL0.27GA0.73AS-IN0.13GA0.87AS GAAS HETEROSTRUCTURE/
Authors: AFANASEV AM ZAITSEV AA IMAMOV RM PASHAEV EM CHUEV MA
Citation: Am. Afanasev et al., POTENTIALITIES OF X-RAY-DIFFRACTOMETRY FOR STUDYING DELTA-LAYERS ON EXAMPLE OF THE AL0.27GA0.73AS-IN0.13GA0.87AS GAAS HETEROSTRUCTURE/, Crystallography reports, 43(4), 1998, pp. 628-630
X-RAY-DIFFRACTION STUDY OF INTERFACES BETWEEN THE LAYERS OF THE ALAS-GA1-XALXAS SUPERLATTICE
Authors: AFANASEV AM ZAITSEV AA IMAMOV RM PASHAEV EM CHUEV MA MOKEROV VG
Citation: Am. Afanasev et al., X-RAY-DIFFRACTION STUDY OF INTERFACES BETWEEN THE LAYERS OF THE ALAS-GA1-XALXAS SUPERLATTICE, Crystallography reports, 43(1), 1998, pp. 129-133
ASYMMETRIC MONOCHROMATOR IN NONCOPLANAR DIFFRACTION GEOMETRY
Authors: PASHAEV EM VAVILOV AV IMAMOV RM AFANASEV AM DJOMKINA TB
Citation: Em. Pashaev et al., ASYMMETRIC MONOCHROMATOR IN NONCOPLANAR DIFFRACTION GEOMETRY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 405(2-3), 1998, pp. 301-304
INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES
Authors: GALIEV GB IMAMOV RM MEDVEDEV BK MOKEROV VG MUKHAMEDZHANOV EK PASHAEV EM CHEGLAKOV VB
Citation: Gb. Galiev et al., INVESTIGATION OF THE STRUCTURAL-PROPERTIES OF GAAS-LAYERS GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES, Semiconductors, 31(10), 1997, pp. 1003-1005
X-RAY-DIFFRACTION IN A NONCOPLANAR GRAZING SCHEME
Authors: AFANASEV AM VAVILOV AB DEMKINA TB IMAMOV RM PASHAEV EM
Citation: Am. Afanasev et al., X-RAY-DIFFRACTION IN A NONCOPLANAR GRAZING SCHEME, Crystallography reports, 42(3), 1997, pp. 360-363
X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS
Authors: BOCCHI C FRANZOSI P IMAMOV RM MASLOV AV MUKHAMEDZHANOV EK PASHAEV EM
Citation: C. Bocchi et al., X-RAY STANDING-WAVE TECHNIQUE AS A SOURCE OF COMPLEMENTARY INFORMATION IN STRUCTURAL CHARACTERIZATION OF THIN SURFACE-LAYERS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(1), 1997, pp. 65-72
NONCOPLANAR DIFFRACTION GEOMETRY IN THE B RAGG-CASE OF GLANCING INCIDENCE OF X-RAYS
Authors: AFANASEV AM VAVILOV AB IMAMOV RM PASHAEV EM
Citation: Am. Afanasev et al., NONCOPLANAR DIFFRACTION GEOMETRY IN THE B RAGG-CASE OF GLANCING INCIDENCE OF X-RAYS, Kristallografia, 41(5), 1996, pp. 804-807
POLARIZATION EFFECT IN THE METHOD OF STAN DING X-RAY WAVES
Authors: PASHAEV EM VAVILOV AB
Citation: Em. Pashaev et Ab. Vavilov, POLARIZATION EFFECT IN THE METHOD OF STAN DING X-RAY WAVES, Fizika tverdogo tela, 37(8), 1995, pp. 2413-2419
X-RAY PHOTOELECTRONS AND POLARIZATION EFF ECT
Authors: PASHAEV EM VAVILOV AA IMAMOV RM
Citation: Em. Pashaev et al., X-RAY PHOTOELECTRONS AND POLARIZATION EFF ECT, Kristallografia, 38(3), 1993, pp. 36-41
STUDY OF SUPERLATTICE TOP LAYERS BY THE S TANDING X-RAY WAVES TECHNIQUE
Authors: AFANASEV AM IMAMOV RM MASLOV AV MOKEROV VG PASHAEV EM VAVILOV AB IGNATEV AS NEMTSEV GZ ZAITSEV AA
Citation: Am. Afanasev et al., STUDY OF SUPERLATTICE TOP LAYERS BY THE S TANDING X-RAY WAVES TECHNIQUE, Kristallografia, 38(3), 1993, pp. 58-62
Risultati: 1-10 |