Authors: LUKYANCHIKOVA N PETRICHUK M GARBAR N SIMOEN E CLAEYS C

Citation: N. Lukyanchikova et al., RTS NOISE DUE TO LATERAL ISOLATION RELATED DEFECTS IN SUBMICRON NMOSFETS, Microelectronics and reliability, 38(10), 1998, pp. 1561-1568

Authors: LUKYANCHIKOVA N PETRICHUK M GARBAR N SIMOEN E CLAEYS C

Citation: N. Lukyanchikova et al., BACK AND FRONT INTERFACE RELATED GENERATION-RECOMBINATION NOISE IN BURIED-CHANNEL SOI PMOSFETS, I.E.E.E. transactions on electron devices, 43(3), 1996, pp. 417-423