Authors: JOELSSON KB NI WX POZINA G PETTERSSON LAA HALLBERG T MONEMAR B HANSSON GV

Citation: Kb. Joelsson et al., CHARACTERIZATION OF STRAINED SI SI1-YCY STRUCTURES PREPARED BY MOLECULAR-BEAM EPITAXY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1621-1626

Authors: ROMAN LS MAMMO W PETTERSSON LAA ANDERSSON MR INGANAS O

Citation: Ls. Roman et al., HIGH QUANTUM EFFICIENCY POLYTHIOPHENE C-60 PHOTODIODES/, Advanced materials, 10(10), 1998, pp. 774-777

Authors: PETTERSSON LAA CARLSSON F INGANAS O ARWIN H

Citation: Laa. Pettersson et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF THE OPTICAL-PROPERTIES OF DOPEDPOLY(3,4-ETHYLENEDIOXYTHIOPHENE) - AN ANISOTROPIC METAL, Thin solid films, 313, 1998, pp. 356-361

Authors: PETTERSSON LAA HULTMAN L ARWIN H

Citation: Laa. Pettersson et al., POROSITY DEPTH PROFILING OF THIN POROUS SILICON LAYERS BY USE OF VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY - A POROSITY GRADED-LAYER, Applied optics, 37(19), 1998, pp. 4130-4136

Authors: GRANLUND T PETTERSSON LAA ANDERSON MR INGANAS O

Citation: T. Granlund et al., INTERFERENCE PHENOMENON DETERMINES THE COLOR IN AN ORGANIC LIGHT-EMITTING DIODE, Journal of applied physics, 81(12), 1997, pp. 8097-8104

Authors: PETTERSSON LAA SNYDER PG

Citation: Laa. Pettersson et Pg. Snyder, PREPARATION AND CHARACTERIZATION OF OXIDIZED SILVER THIN-FILMS, Thin solid films, 270(1-2), 1995, pp. 69-72