Kb. Joelsson et al., CHARACTERIZATION OF STRAINED SI SI1-YCY STRUCTURES PREPARED BY MOLECULAR-BEAM EPITAXY/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1621-1626
Various structures containing Si1-yCy alloy layers have been prepared
and characterized by x-ray diffraction , cross sectional transmission
electron microscopy, photoluminescence (PL), Fourier transform infrare
d spectroscopy, and spectroscopic ellipsometry. A band gap reduction e
qual to 63 meV/% C has been estimated from PL when taking into account
the quantum well (QW) confinement shift using an effective mass calcu
lation. The QW-related emission observed from a multiple QW structure
has a temperature quenching behavior with an activation energy equal t
o 8 meV. Carbon outdiffusion from the QWs has been evidenced by a blue
shift of the PL peak and changes in the x-ray diffraction data after f
urnace annealing at 800 and 850 degrees C. (C) 1998 American Vacuum So
ciety.