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Results:
1-14
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Results: 14
Authors:
PHAM MT
MOLLER D
MATZ W
MUCKLICH A
OSWALD S
Citation: Mt. Pham et al., CDS NANOCRYSTALS ENTRAPPED IN THIN SIO2-FILMS, JOURNAL OF PHYSICAL CHEMISTRY B, 102(21), 1998, pp. 4081-4088
Authors:
STEINER G
PHAM MT
KUHNE C
SALZER R
Citation: G. Steiner et al., SURFACE-PLASMON RESONANCE WITHIN ION-IMPLANTED SILVER CLUSTERS, Fresenius' journal of analytical chemistry, 362(1), 1998, pp. 9-14
Authors:
MATZ W
PHAM MT
MUCKLICH A
Citation: W. Matz et al., NANOMETER-SIZED SILVER-HALIDES ENTRAPPED IN SIO2 MATRICES, Journal of Materials Science, 33(1), 1998, pp. 155-159
Authors:
MOLLER D
PHAM MT
HULLER J
Citation: D. Moller et al., SENSITIZATION OF SILICON-NITRIDE SURFACES FOR AG-IMPLANTATION( IONS BY ION), Sensors and actuators. B, Chemical, 43(1-3), 1997, pp. 110-113
Authors:
PHAM MT
JOHAR GV
Citation: Mt. Pham et Gv. Johar, CONTINGENT PROCESSES OF SOURCE IDENTIFICATION, Journal of consumer research, 24(3), 1997, pp. 249-265
Authors:
PHAM MT
ZYGANOW I
MATZ W
REUTHER H
OSWALD S
RICHTER E
WIESER E
Citation: Mt. Pham et al., CORROSION BEHAVIOR AND MICROSTRUCTURE OF TITANIUM IMPLANTED WITH ALPHA-STABILIZING AND BETA-STABILIZING ELEMENTS, Thin solid films, 310(1-2), 1997, pp. 251-259
Authors:
PHAM MT
MATZ W
SEIFARTH H
Citation: Mt. Pham et al., SURFACE-ROUGHNESS WITH NANOMETER-SCALE AG PARTICLES GENERATED BY ION-IMPLANTATION, Analytica chimica acta, 350(1-2), 1997, pp. 209-220
Authors:
PHAM MT
Citation: Mt. Pham, CUE REPRESENTATION AND SELECTION EFFECTS OF AROUSAL ON PERSUASION, Journal of consumer research, 22(4), 1996, pp. 373-387
Authors:
PHAM MT
MATZ W
MOLLER D
HULLER J
Citation: Mt. Pham et al., ION-BEAM SENSITIZED SIO2 SURFACE FOR HALIDE-IONS, Analytica chimica acta, 320(2-3), 1996, pp. 289-291
Authors:
PHAM MT
Citation: Mt. Pham, ANALYSIS OF THE TIME-DEPENDENCE OF INTERFACIAL POTENTIALS AT ION-CONDUCTING MEMBRANES COUPLED TO FIELD-EFFECT DEVICES, Journal of electroanalytical chemistry [1992], 388(1-2), 1995, pp. 17-24
Authors:
HULLER J
PHAM MT
VOPEL T
ALBRECHT J
Citation: J. Huller et al., ION-BEAM MODIFICATION OF ISFET MEMBRANES FOR COPPER-ION DETECTION, Sensors and actuators. B, Chemical, 24(1-3), 1995, pp. 225-227
Authors:
PHAM MT
HOWITZ S
KUNATH C
KURTH E
KOHLER H
Citation: Mt. Pham et al., BACKSIDE MEMBRANE STRUCTURES FOR ISFETS APPLIED IN MINIATURE ANALYSISSYSTEMS, Sensors and actuators. B, Chemical, 19(1-3), 1994, pp. 333-335
Authors:
ALBRECHT J
KOCH B
PHAM MT
Citation: J. Albrecht et al., DETERMINATION OF AN ACCURATE DEPTH DISTRIBUTION OF SODIUM, CALCIUM AND ALUMINUM IN THIN OXIDE LAYERS USING SEVERAL METHODS, Fresenius' journal of analytical chemistry, 346(1-3), 1993, pp. 310-314
Authors:
PHAM MT
HOWITZ S
HUELLER J
ALBRECHT J
KOCH B
VOEHSE H
Citation: Mt. Pham et al., SPECTROSCOPIC AND ELECTROCHEMICAL PROPERTIES OF ION-SENSING MEMBRANESFABRICATED BY ION-IMPLANTATION, Sensors and actuators. B, Chemical, 14(1-3), 1993, pp. 746-748
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