Authors: OLIVETI G PICCIRILLO A BAGNOLI PE

Citation: G. Oliveti et al., ANALYSIS OF LASER-DIODE THERMAL-PROPERTIES WITH SPATIAL-RESOLUTION BYMEANS OF THE TRAIT METHOD, Microelectronics, 28(3), 1997, pp. 293-300

Authors: PICCIRILLO A MORO L NATTA D RE D LAZZERI P

Citation: A. Piccirillo et al., THE IMPACT OF SOURCE COMPOSITION EVOLUTION ON OPTICAL COATING CHARACTERISTICS, Microelectronics, 25(7), 1994, pp. 589-599

Authors: PICCIRILLO A OLIVETI G CIAMPA M BAGNOLI PE

Citation: A. Piccirillo et al., COMPLETE CHARACTERIZATION OF LASER-DIODE THERMAL CIRCUIT BY VOLTAGE TRANSIENT MEASUREMENTS, Electronics Letters, 29(3), 1993, pp. 318-320

Authors: BAGNOLI PE PICCIRILLO A

Citation: Pe. Bagnoli et A. Piccirillo, COMPLETE CHARACTERIZATION OF LASER-DIODE THERMAL CIRCUIT BY VOLTAGE TRANSIENT MEASUREMENTS - REPLY, Electronics Letters, 29(11), 1993, pp. 1023-1023

Authors: ARNOT HEG GLEW RW SCHIAVINI G RIGBY LJ PICCIRILLO A

Citation: Heg. Arnot et al., SELECTIVE ETCHING OF INP AND INGAASP OVER ALINAS USING CH4 H2 REACTIVE ION ETCHING/, Applied physics letters, 62(24), 1993, pp. 3189-3191