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Authors:
SCHIELKE W
ROTTIG G
BANDLOW I
PICKALOV V
OHL A
Citation: W. Schielke et al., ON THE CAPABILITY OF SPECTRALLY RESOLVED OPTICAL-EMISSION TOMOGRAPHY FOR THE DIAGNOSTIC OF NONISOTHERMAL LOW-PRESSURE TECHNOLOGICAL PLASMAS, Surface & coatings technology, 97(1-3), 1997, pp. 742-748