Authors:
LI XY
DIVAKARUNI R
HSU JT
PRABHAKAR V
AUM P
CHAN D
VISWANATHAN CR
Citation: Xy. Li et al., EFFECT OF PLASMA POLY-ETCH ON EFFECTIVE CHANNEL-LENGTH AND HOT-CARRIER RELIABILITY IN SUBMICRON TRANSISTORS, IEEE electron device letters, 15(4), 1994, pp. 140-141
Citation: R. Divakaruni et al., ACTIVATION-ENERGY DETERMINATION FROM LOW-TEMPERATURE CV DISPERSION, I.E.E.E. transactions on electron devices, 41(8), 1994, pp. 1405-1413