Authors:
GOROKHOV EB
PRINZ VY
NOSKOV AG
GAVRILOVA TA
Citation: Eb. Gorokhov et al., A NOVEL NANOLITHOGRAPHIC CONCEPT USING CRACK-ASSISTED PATTERNING AND SELF-ALIGNMENT TECHNOLOGY, Journal of the Electrochemical Society, 145(6), 1998, pp. 2120-2131
Citation: Ia. Panaev et Vy. Prinz, NONDESTRUCTIVE AND CONTACTLESS MICROWAVE METHODS FOR PROFILING THE MOBILITY IN ACTIVE LAYERS OF MULTILAYER STRUCTURES GROWN ON SEMIINSULATING SUBSTRATES, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 130-133
Authors:
PRINZ VY
SELEZNEV VA
SAMOYLOV VA
GUTAKOVSKY AK
Citation: Vy. Prinz et al., NANOSCALE ENGINEERING USING CONTROLLABLE FORMATION OF ULTRA-THIN CRACKS IN HETEROSTRUCTURES, Microelectronic engineering, 30(1-4), 1996, pp. 439-442