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Results: 1-10 |
Results: 10
On the origin of the 1100cm (-1) Raman band in amorphous and nanocrystalline sp(3) carbon
Authors: Paillard, V
Citation: V. Paillard, On the origin of the 1100cm (-1) Raman band in amorphous and nanocrystalline sp(3) carbon, EUROPH LETT, 54(2), 2001, pp. 194-198
Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry
Authors: Paillard, V Puech, P Sirvin, R Hamma, S Cabarrocas, PRI
Citation: V. Paillard et al., Measurement of the in-depth stress profile in hydrogenated microcrystalline silicon thin films using Raman spectrometry, J APPL PHYS, 90(7), 2001, pp. 3276-3279
Photoluminescence of silicon nanocrystallites: an astrophysical application
Authors: Ledoux, G Guillois, O Reynaud, C Huisken, F Kohn, B Paillard, V
Citation: G. Ledoux et al., Photoluminescence of silicon nanocrystallites: an astrophysical application, MAT SCI E B, 69, 2000, pp. 350-354
Laser production and deposition of light-emitting silicon nanoparticles
Authors: Huisken, F Hofmeister, H Kohn, B Laguna, MA Paillard, V
Citation: F. Huisken et al., Laser production and deposition of light-emitting silicon nanoparticles, APPL SURF S, 154, 2000, pp. 305-313
Photoluminescence properties of silicon nanocrystals as a function of their size
Authors: Ledoux, G Guillois, O Porterat, D Reynaud, C Huisken, F Kohn, B Paillard, V
Citation: G. Ledoux et al., Photoluminescence properties of silicon nanocrystals as a function of their size, PHYS REV B, 62(23), 2000, pp. 15942-15951
Structure of mixed-phase LPCVD silicon films as a function of operating conditions
Authors: de Mauduit, B Bourgerette, C Paillard, V Puech, P Caussat, B
Citation: B. De Mauduit et al., Structure of mixed-phase LPCVD silicon films as a function of operating conditions, J PHYS IV, 9(P8), 1999, pp. 1091-1098
Improved characterization of polycrystalline silicon film, by resonant Raman scattering
Authors: Paillard, V Puech, P Temple-Boyer, P Caussat, B Scheid, E Couderc, JP de Mauduit, B
Citation: V. Paillard et al., Improved characterization of polycrystalline silicon film, by resonant Raman scattering, THIN SOL FI, 337(1-2), 1999, pp. 93-97
Improved one-phonon confinement model for an accurate size determination of silicon nanocrystals
Authors: Paillard, V Puech, P Laguna, MA Carles, R Kohn, B Huisken, F
Citation: V. Paillard et al., Improved one-phonon confinement model for an accurate size determination of silicon nanocrystals, J APPL PHYS, 86(4), 1999, pp. 1921-1924
Structured films of light-emitting silicon nanoparticles produced by cluster beam deposition
Authors: Huisken, F Kohn, B Paillard, V
Citation: F. Huisken et al., Structured films of light-emitting silicon nanoparticles produced by cluster beam deposition, APPL PHYS L, 74(25), 1999, pp. 3776-3778
Optical properties of nanocrystalline silicon thin films produced by size-selected cluster beam deposition
Authors: Laguna, MA Paillard, V Kohn, B Ehbrecht, M Huisken, F Ledoux, G Papoular, R Hofmeister, H
Citation: Ma. Laguna et al., Optical properties of nanocrystalline silicon thin films produced by size-selected cluster beam deposition, J LUMINESC, 80(1-4), 1998, pp. 223-228
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