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Citation: S. Pelletier et al., Scanning tunneling microscopy study of the Er/Ge(111) c(2X8) interface, J VAC SCI A, 18(6), 2000, pp. 2738-2741

Authors: Palmino, F Pelletier, S Ehret, E Gautier, B Labrune, JC

Citation: F. Palmino et al., Er deposition in the submonolayer range on weakly boron-doped Si(111) surface, J VAC SCI A, 18(5), 2000, pp. 2239-2243

Authors: Palmino, F Klein, D Labrune, JC

Citation: F. Palmino et al., Observation of nuclear track in organic material by atomic force microscopy in real time during etching, RADIAT MEAS, 31(1-6), 1999, pp. 209-212

Authors: Boichot, S Fromm, M Savall, C Palmino, F Labrune, JC Chambaudet, A

Citation: S. Boichot et al., Detection threshold in muscovite mica: Influence of the observation tool, RADIAT MEAS, 31(1-6), 1999, pp. 233-236

Authors: Pelletier, S Ehret, E Gautier, B Palmino, F Labrune, JC Wetzel, P Pirri, C Gewinner, G

Citation: S. Pelletier et al., Two-dimensional epitaxial ErSi2 grown on B-passivated Si(111)-root 3x root3R30 degrees surfaces, PHYS REV B, 60(16), 1999, pp. 11645-11652