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Results: 1-8 |
Results: 8

Authors: Laskarakis, A Logothetidis, S Charitidis, C Gioti, M Panayiotatos, Y Handrea, M Kautek, W
Citation: A. Laskarakis et al., A study on the bonding structure and mechanical properties of magnetron sputtered CNx thin films, DIAM RELAT, 10(3-7), 2001, pp. 1179-1184

Authors: Hastas, NA Dimitriadis, CA Patsalas, P Panayiotatos, Y Tassis, DH Logothetidis, S
Citation: Na. Hastas et al., Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions, J APPL PHYS, 89(5), 2001, pp. 2832-2838

Authors: Dimitriadis, CA Hastas, NA Vouroutzis, N Logothetidis, S Panayiotatos, Y
Citation: Ca. Dimitriadis et al., Microstructure and its effect on the conductivity of magnetron sputtered carbon thin films, J APPL PHYS, 89(12), 2001, pp. 7954-7959

Authors: Hastas, NA Dimitriadis, CA Tassis, DH Panayiotatos, Y Logothetidis, S Papadimitriou, D
Citation: Na. Hastas et al., Electrical properties of magnetron sputtered amorphous carbon films with sequential sp(3)-rich/sp(2)-rich layered structure, APPL PHYS L, 79(20), 2001, pp. 3269-3271

Authors: Konofaos, N Angelis, CT Evangelou, EK Panayiotatos, Y Dimitriadis, CA Logothetidis, S
Citation: N. Konofaos et al., Electrical characterization of TiN/a-C/Si devices grown by magnetron sputtering at room temperature, APPL PHYS L, 78(12), 2001, pp. 1682-1684

Authors: Logothetidis, S Charitidis, C Gioti, M Panayiotatos, Y Handrea, M Kautek, W
Citation: S. Logothetidis et al., Comprehensive study on the properties of multilayered amorphous carbon films, DIAM RELAT, 9(3-6), 2000, pp. 756-760

Authors: Gioti, M Logothetidis, S Patsalas, P Laskarakis, A Panayiotatos, Y Kechagias, V
Citation: M. Gioti et al., Magnetron sputtered carbon nitride: composition and chemical bonding of as-grown and post-annealed films studied with real-time and in situ diagnostic techniques, SURF COAT, 125(1-3), 2000, pp. 289-294

Authors: Hastas, NA Dimitriadis, CA Panayiotatos, Y Tassis, DH Patsalas, P Logothetidis, S
Citation: Na. Hastas et al., Noise characterization of sputtered amorphous carbon films, J APPL PHYS, 88(9), 2000, pp. 5482-5484
Risultati: 1-8 |