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Citation: B. Kaczer et al., The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films, IEEE DEVICE, 47(7), 2000, pp. 1514-1521

Authors: Kaczer, B Degraeve, R Pangon, N Nigam, T Groeseneken, G

Citation: B. Kaczer et al., Investigation of temperature acceleration of thin oxide time-to-breakdown, MICROEL ENG, 48(1-4), 1999, pp. 47-50