Authors:
Pelka, JB
Paszkowicz, W
Dluzewski, P
Brust, M
Kiely, CJ
Knapp, M
Czerwosz, E
Citation: Jb. Pelka et al., Characterisation of thin films containing Au and Pd nanoparticles by grazing-incidence X-ray diffraction and related methods, J ALLOY COM, 328(1-2), 2001, pp. 248-252
Authors:
Pelka, JB
Paszkowicz, W
Dluzewski, P
Dynowska, E
Wawro, A
Baczewski, LT
Kozlowski, M
Wisniewski, A
Seeck, O
Messoloras, S
Gamari-Seale, H
Citation: Jb. Pelka et al., Structural and magnetic study of Co/Gd multilayers deposited on Si and Si-N substrates, J PHYS D, 34(10A), 2001, pp. A208-A213
Authors:
Pelka, JB
Cedola, A
Lagomarsino, S
di Fonzo, S
Jark, W
Soullie, G
Citation: Jb. Pelka et al., Application of resonance-enhanced X-ray standing waves to the study of layered structures by grazing-incidence X-ray reflectometry and secondary radiation, J ALLOY COM, 286(1-2), 1999, pp. 313-321
Authors:
Pelka, JB
Auleytner, J
Domagala, J
Werner, Z
Janik-Czachor, M
Citation: Jb. Pelka et al., Study of near-surface layers modified by ion implantation in Si wafers by grazing incidence X-ray reflectometry, J ALLOY COM, 286(1-2), 1999, pp. 337-342