Citation: Tr. Yang et Zb. Peng, An improved register-transfer level functional partitioning approach for testability, J SYST ARCH, 46(3), 2000, pp. 209-223
Citation: Tr. Yang et Zb. Peng, Incremental testability analysis for partial scan selection and design transformations, J ELEC TEST, 14(1-2), 1999, pp. 103-113