Authors: Kiselev, AN Perevoshchikov, VA Skupov, VD Filatov, DO

Citation: An. Kiselev et al., X-ray irradiation at subthreshold energies modifies the surface micromorphology of epitaxial silicon layers on sapphire, TECH PHYS L, 27(9), 2001, pp. 725-727

Authors: Shchurov, AF Kruglov, AV Perevoshchikov, VA

Citation: Af. Shchurov et al., Band structure and low-temperature plasticity of covalent crystals, INORG MATER, 37(4), 2001, pp. 349-353

Authors: Demidov, ES Latysheva, ND Perevoshchikov, VA Skupov, AV Skupov, VD

Citation: Es. Demidov et al., Effect of ion irradiation on the depth profiles of microdefects in silicon, INORG MATER, 36(5), 2000, pp. 422-425

Authors: Perevoshchikov, VA Skupov, VD

Citation: Va. Perevoshchikov et Vd. Skupov, Long-range gettering of microdefects in silicon single crystals during theformation of porous silicon layers on their surface and ion irradiation, TECH PHYS L, 25(4), 1999, pp. 315-316