Authors: Traving, M Seydel, T Kipp, L Skibowski, M Starrost, F Krasovskii, EE Perlov, A Schattke, W

Citation: M. Traving et al., Combined photoemission and inverse photoemission study of HfS2 - art. no. 035107, PHYS REV B, 6303(3), 2001, pp. 5107

Authors: Cubiotti, G Kucherenko, Y Yaresko, A Perlov, A Antonov, V

Citation: G. Cubiotti et al., Local electronic structure around vacancies and vacancy-antisite complexesin beta-SiC, J PHYS-COND, 12(14), 2000, pp. 3369-3381

Authors: Castillo-Mejia, D Perlov, A Beaudoin, S

Citation: D. Castillo-mejia et al., Qualitative prediction of SiO2 removal rates during chemical mechanical polishing, J ELCHEM SO, 147(12), 2000, pp. 4671-4675

Authors: Cubiotti, G Kucherenko, Y Yaresko, A Perlov, A Antonov, V

Citation: G. Cubiotti et al., The effect of the atomic relaxation around defects on the electronic structure and optical properties of beta-SiC, J PHYS-COND, 11(10), 1999, pp. 2265-2278