Authors:
Marchi, F
Tonneau, D
Dallaporta, H
Pierrisnard, R
Bouchiat, V
Safarov, VI
Doppelt, P
Even, R
Citation: F. Marchi et al., Nanometer scale patterning by scanning tunelling microscope assisted chemical vapour deposition, MICROEL ENG, 50(1-4), 2000, pp. 59-65