Authors: Hytch, MJ Plamann, T

Citation: Mj. Hytch et T. Plamann, Imaging conditions for reliable measurement of displacement and strain in high-resolution electron microscopy, ULTRAMICROS, 87(4), 2001, pp. 199-212

Authors: Plamann, T Hytch, MJ

Citation: T. Plamann et Mj. Hytch, Tests on the validity of the atomic column approximation for STEM probe propagation, ULTRAMICROS, 78(1-4), 1999, pp. 153-161