Authors:
List, EJW
Kim, CH
Shinar, J
Pogantsch, A
Petritsch, K
Leising, G
Graupner, W
Citation: Ejw. List et al., Defect characterization of highly emissive para-phenylene-type molecular films by photoluminescence-detected magnetic resonance and thermally stimulated charge transport, SYNTH METAL, 116(1-3), 2001, pp. 81-85