Authors:
Kravchuk, VL
van den Berg, AM
Fleurot, F
de Huu, MA
Lohner, H
Wilschut, HW
Polasik, M
Lewandowska-Robak, M
Slabkowska, K
Citation: Vl. Kravchuk et al., K- and L-shell ionization of heavy targets by various 20-and 80-MeV/u projectiles - art. no. 062710, PHYS REV A, 6406(6), 2001, pp. 2710
Authors:
Pajek, M
Banas, D
Castella, D
Corminboeuf, D
Dousse, JC
Maillard, YP
Mauron, O
Raboud, PA
Chmielewska, D
Fijal, I
Jaskola, M
Korman, A
Ludziejewski, T
Rzadkiewicz, J
Sujkowski, Z
Hoszowska, J
Polasik, M
Mukoyama, T
Citation: M. Pajek et al., High-resolution measurements of Th and U L gamma-X-rays induced by energetic O ions, PHYS SCR, T92, 2001, pp. 382-384
Authors:
Raj, S
Padhi, HC
Raychaudhury, P
Nigam, AK
Pinto, R
Polasik, M
Pawlowski, F
Basa, DK
Citation: S. Raj et al., Valence electronic structure of Mn in undoped and doped lanthanum manganites from relative K X-ray intensity studies, NUCL INST B, 174(3), 2001, pp. 344-350
Authors:
Raj, S
Padhi, HC
Polasik, M
Pawlowski, F
Basa, DK
Citation: S. Raj et al., K beta-to-K alpha x-ray intensity ratio studies of the valence electronic structure of Fe and Ni in FexNi1-x alloys - art. no. 073109, PHYS REV B, 6307(7), 2001, pp. 3109
Authors:
Mauron, O
Dousse, JC
Hoszowska, J
Marques, JP
Parente, F
Polasik, M
Citation: O. Mauron et al., L-shell shake processes resulting from 1s photoionization in elements 11 <= Z <= 17 - art. no. 062508, PHYS REV A, 6206(6), 2000, pp. 2508
Citation: F. Pawlowski et al., K beta/K alpha X-ray intensity ratio studies on the valence electronic states of 3d-transition metals in some of their compounds, ACT PHY P B, 31(2), 2000, pp. 495-499
Authors:
Rzadkiewicz, J
Chmielewska, D
Ludziejewski, T
Rymuza, P
Sujkowski, Z
Castella, D
Corminboeuf, D
Dousse, JC
Kern, J
Galley, B
Herren, C
Hoszowska, J
Polasik, M
Pajek, M
Citation: J. Rzadkiewicz et al., Double K-shell ionization in collisions of fast ions with mid-z atoms, ACT PHY P B, 31(2), 2000, pp. 501-505
Citation: K. Slabkowska et al., Effect of L- and M-shell ionization on the K X-ray spectra parameters of sulphur, ACT PHY P B, 31(2), 2000, pp. 507-510
Authors:
Majewska, U
Braziewicz, J
Banas, D
Jaskola, M
Czyzewski, T
Kretschmer, W
Slabkowska, K
Pawlowski, F
Polasik, M
Citation: U. Majewska et al., Interpretation of K X-ray spectra from highly ionized sulphur projectiles passing through thin carbon foils, ACT PHY P B, 31(2), 2000, pp. 511-516
Citation: S. Raj et al., Influence of chemical effect on the K beta-to-K alpha x-ray intensity ratios of Cr, Mn and Co in CrSe, MnSe, MnS and CoS, NUCL INST B, 160(4), 2000, pp. 443-448
Authors:
Raj, S
Padhi, HC
Polasik, M
Pawlowski, F
Basa, DK
Citation: S. Raj et al., Valence electronic structure of Fe and Ni in FexNi1-x alloys from relativeK X-ray intensity studies, SOL ST COMM, 116(10), 2000, pp. 563-567
Authors:
Polasik, M
Raj, S
Dhal, BB
Padhi, HC
Saha, AK
Kurup, MB
Prasad, KG
Tandon, PN
Citation: M. Polasik et al., Simultaneous L- and M-shell ionization of a Se-80 target deduced from the analysis of energy shifts and relative intensities of K x-ray lines inducedby various projectiles, J PHYS B, 32(15), 1999, pp. 3711-3725
Authors:
Rzadkiewicz, J
Chmielewska, D
Ludziejewski, T
Rymuza, P
Sujkowski, Z
Castella, D
Corminboeuf, D
Dousse, JC
Galley, B
Herren, C
Hoszowska, J
Kern, J
Polasik, M
Pajek, M
Citation: J. Rzadkiewicz et al., He-like hole states in mid-Z atoms studied by high-resolution K X-ray spectroscopy, PHYS LETT A, 264(2-3), 1999, pp. 186-191
Citation: S. Raj et al., Influence of alloying effect on K beta/K alpha X-ray intensity ratios of Vand Ni in VxNi1-x alloys, NUCL INST B, 155(1-2), 1999, pp. 143-152
Authors:
Raj, S
Padhi, HC
Basa, DK
Polasik, M
Pawlowski, F
Citation: S. Raj et al., K beta-to-K alpha X-ray intensity ratio studies on the changes of valence electronic structures of Ti, V, Cr, and Co in their disilicide compounds, NUCL INST B, 152(4), 1999, pp. 417-424
Citation: S. Raj et al., Influence of chemical effect on the KP-to-K alpha X-ray intensity ratios of Ti, V, Cr and Fe in TiC, VC, CrB, CrB2 and FeB, NUCL INST B, 145(4), 1998, pp. 485-491