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Results:
1-7
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Results: 7
Authors:
Polignano, ML
Carpanese, C
Crivelli, B
Giussani, A
Zonca, R
Bersani, A
Citation: Ml. Polignano et al., Interface properties of annealed and nitrided HTO layers, MICROEL ENG, 59(1-4), 2001, pp. 379-384
Authors:
Polignano, ML
Alessandri, M
Crivelli, B
Zonca, R
Caricato, AP
Bersani, M
Sbetti, M
Vanzetti, L
Citation: Ml. Polignano et al., The impact of the nitridation process on the properties of the Si-SiO2 interface, J NON-CRYST, 280(1-3), 2001, pp. 39-47
Authors:
Polignano, ML
Ghidini, G
Cazzaniga, F
Ceresara, L
Illuzzi, F
Padovani, B
Pellizzer, F
Citation: Ml. Polignano et al., Thin oxide reliability and gettering efficiency in advanced silicon substrates, MAT SCI E B, 73(1-3), 2000, pp. 99-105
Authors:
Polignano, ML
Caricato, AP
Modelli, A
Zonca, R
Citation: Ml. Polignano et al., Surface characterization by photocurrent measurements, APPL SURF S, 154, 2000, pp. 276-282
Authors:
Polignano, ML
Caricato, AP
Modelli, A
Zonca, R
Citation: Ml. Polignano et al., A novel method for the simultaneous characterization of bulk impurities and surface states by photocurrent measurements, J ELCHEM SO, 147(4), 2000, pp. 1577-1582
Authors:
Spiga, S
Castaldini, A
Cavallini, A
Polignano, ML
Cazzaniga, F
Citation: S. Spiga et al., Denuded zone and diffusion length investigation by electron beam induced current technique in intrinsically gettered Czochralski silicon, J APPL PHYS, 85(3), 1999, pp. 1395-1400
Authors:
Polignano, ML
Bellafiore, N
Caputo, D
Caricato, AP
Modelli, A
Zonca, R
Citation: Ml. Polignano et al., Surface recombination velocity from photocurrent measurements - Validationand applications, J ELCHEM SO, 146(12), 1999, pp. 4640-4646
Risultati:
1-7
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