Authors:
Doumerc, JP
Coutanceau, M
Demourgues, A
Elkaim, E
Grenier, JC
Pouchard, M
Citation: Jp. Doumerc et al., Crystal structure of the thallium strontium cobaltite TlSr2CoO5 and its relationship to the electronic properties, J MAT CHEM, 11(1), 2001, pp. 78-85
Authors:
Jacob, A
Barbut, D
Wattiaux, A
Delville, MH
Grenier, JC
Pouchard, M
Etourneau, J
Citation: A. Jacob et al., Electrochemical intercalation of oxygen into La2CuO4 using anhydrous organic electrolytic media, J MAT CHEM, 10(4), 2000, pp. 829-831
Authors:
Brunet, F
Melinon, P
San Miguel, A
Keghelian, P
Perez, A
Flank, AM
Reny, E
Cros, C
Pouchard, M
Citation: F. Brunet et al., Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: AnEXAFS study, PHYS REV B, 61(24), 2000, pp. 16550-16560
Authors:
Audinot, JN
Bassat, JM
Wattiaux, A
Grenier, JC
Pouchard, M
Citation: Jn. Audinot et al., Investigations of the LaGa1-xNixO3-delta K (x <= 0.50) system in the scopeof SOFC's: synthesis and physical characterizations, CR AC S IIC, 2(2), 1999, pp. 69-73
Authors:
Tolla, B
Demourgues, A
Isnard, O
Menetrier, M
Pouchard, M
Rabardel, L
Seguelong, T
Citation: B. Tolla et al., Structural investigation of oxygen insertion within the Ce2Sn2O7-Ce2Sn2O8 pyrochlore solid solution by means of in situ neutron diffraction experiments, J MAT CHEM, 9(12), 1999, pp. 3131-3136
Authors:
Grenier, JC
Bassat, JM
Doumerc, JP
Etourneau, J
Fang, Z
Fournes, L
Petit, S
Pouchard, M
Wattiaux, A
Citation: Jc. Grenier et al., Relevant examples of intercalation-deintercalation processes in solid state chemistry: application to oxides, J MAT CHEM, 9(1), 1999, pp. 25-33
Authors:
Melinon, P
Keghelian, P
Perez, A
Champagnon, B
Guyot, Y
Saviot, L
Reny, E
Cros, C
Pouchard, M
Dianoux, AJ
Citation: P. Melinon et al., Phonon density of states of silicon clathrates: Characteristic width narrowing effect with respect to the diamond phase, PHYS REV B, 59(15), 1999, pp. 10099-10104
Authors:
San-Miguel, A
Keghelian, P
Blase, X
Melinon, P
Perez, A
Itie, JP
Polian, A
Reny, E
Cros, C
Pouchard, M
Citation: A. San-miguel et al., High pressure behavior of silicon clathrates: A new class of low compressibility materials, PHYS REV L, 83(25), 1999, pp. 5290-5293
Authors:
Doumerc, JP
Grenier, JC
Hagenmuller, P
Pouchard, M
Villesuzanne, A
Citation: Jp. Doumerc et al., Interplay between local electronic configuration and the occurrence of a metallic state: An experimental approach, J SOL ST CH, 147(1), 1999, pp. 211-217
Authors:
Villesuzanne, A
Elissalde, C
Pouchard, M
Ravez, J
Citation: A. Villesuzanne et al., New considerations on the role of covalency in ferroelectric niobates and tantalates, EUR PHY J B, 6(3), 1998, pp. 307-312
Citation: E. Reny et al., Structural characterisations of the NaxSi136 and Na8Si46 silicon clathrates using the Rietveld method, J MAT CHEM, 8(12), 1998, pp. 2839-2844
Authors:
Melinon, P
Keghelian, P
Blase, X
Le Brusc, J
Perez, A
Reny, E
Cros, C
Pouchard, M
Citation: P. Melinon et al., Electronic signature of the pentagonal rings in silicon clathrate phases: Comparison with cluster-assembled films, PHYS REV B, 58(19), 1998, pp. 12590-12593