Authors: Zalar, A Jagielski, J Mozetic, M Pracek, B Panjan, P

Citation: A. Zalar et al., Ion beam mixing of Ni/Al multilayer structure at different temperatures, VACUUM, 61(2-4), 2001, pp. 291-296

Authors: Koller, L Bizjak, M Pracek, B

Citation: L. Koller et al., Cleaning of thin passivation layers on Ag contact material by vacuum outgassing, VACUUM, 60(1-2), 2001, pp. 175-178

Authors: Zalar, A Pracek, B Panjan, P

Citation: A. Zalar et al., Effects of surface structure on depth resolution of AES depth profiles of Ni/Cr multilayers, SURF INT AN, 30(1), 2000, pp. 247-250

Authors: Gracin, D Jaksic, M Yang, C Borjanovic, V Pracek, B

Citation: D. Gracin et al., Quantitative analysis of a-Si1-xCx : H thin films, APPL SURF S, 145, 1999, pp. 188-191