Authors:
Gerlock, JL
Prater, TJ
Kaberline, SL
Dupuie, JL
Blais, EJ
Rardon, DE
Citation: Jl. Gerlock et al., O-18(-) time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems, POLYM DEGR, 65(1), 1999, pp. 37-45