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Authors: Gerlock, JL Prater, TJ Kaberline, SL Dupuie, JL Blais, EJ Rardon, DE
Citation: Jl. Gerlock et al., O-18(-) time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems, POLYM DEGR, 65(1), 1999, pp. 37-45
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