Authors: Prume, K Hoffmann, S Waser, R

Citation: K. Prume et al., Finite element simulations of interdigital electrode structures on high permittivity thin films, INTEGR FERR, 32(1-4), 2001, pp. 755-764

Authors: Tiedke, S Schmitz, T Prume, K Roelofs, A Schneller, T Kall, U Waser, R Ganpule, CS Nagarajan, V Stanishevsky, A Ramesh, R

Citation: S. Tiedke et al., Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope, APPL PHYS L, 79(22), 2001, pp. 3678-3680

Authors: Franken, K Maier, HR Prume, K Waser, R

Citation: K. Franken et al., Finite-element analysis of ceramic multilayer capacitors: Failure probability caused by wave soldering and bending loads, J AM CERAM, 83(6), 2000, pp. 1433-1440

Authors: Prume, K Waser, R Franken, K Maier, HR

Citation: K. Prume et al., Finite-element analysis of ceramic multilayer capacitors: Modeling and electrical impedance spectroscopy for a nondestructive failure test, J AM CERAM, 83(5), 2000, pp. 1153-1159

Authors: Prume, K Leuerer, T Waser, R

Citation: K. Prume et al., 3-dimensional FEM simulations of resonances in the impedance characteristic of ceramic multilayer capacitors, FERROELECTR, 224(1-4), 1999, pp. 613-622