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Results:
1-2
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Results: 2
Authors:
QUAAS M
WULFF H
Citation: M. Quaas et H. Wulff, STRUCTURAL STUDIES OF ITO FILMS USING GRAZING-INCIDENCE X-RAY-DIFFRACTOMETRY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 617-618
Authors:
QUAAS M
EGGS C
WULFF H
Citation: M. Quaas et al., STRUCTURAL STUDIES OF ITO THIN-FILMS WITH THE RIETVELD METHOD, Thin solid films, 332(1-2), 1998, pp. 277-281
Risultati:
1-2
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