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Citation: Mx. Qiu et al., Threshold conditions for bulk second-order nonlinearity and near-surface second-order nonlinearity in thermally poled Infrasil silica, OPT REV, 8(3), 2001, pp. 159-162

Authors: Qiu, MX Vilaseca, R Cojocaru, C Martorell, J Mizunami, T

Citation: Mx. Qiu et al., Second-order optical nonlinearity generated by doping the surface layer ofsilica with anions or cations, J APPL PHYS, 88(8), 2000, pp. 4666-4670

Authors: Qiu, MX Vilaseca, R Botey, M Sellares, J Pi, F Orriols, G

Citation: Mx. Qiu et al., Double fitting of Maker fringes to characterize near-surface and bulk second-order nonlinearities in poled silica, APPL PHYS L, 76(23), 2000, pp. 3346-3348

Authors: Qiu, MX Takagaki, Y Egawa, S Mizunami, T Vilaseca, R

Citation: Mx. Qiu et al., Large second-order susceptibility generated in the cathodic face of silicaby doping F- anions, OPT COMMUN, 172(1-6), 1999, pp. 97-101

Authors: Qiu, MX Mizunami, T Takagaki, Y Vilaseca, R Martorell, J

Citation: Mx. Qiu et al., Study of the second-order susceptibility from the cathode-side face of poled glasses, J NON-CRYST, 255(2-3), 1999, pp. 250-253