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Results: 1-8 |
Results: 8
Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings
Authors: Saerens, A Van Houtte, P Meert, B Quaeyhaegens, C
Citation: A. Saerens et al., Assessment of different X-ray stress measuring techniques for thin titanium nitride coatings, J APPL CRYS, 33, 2000, pp. 312-322
Modeling of nitride layer formation during plasma nitriding of iron
Authors: Dimitrov, VI D'Haen, J Knuyt, G Quaeyhaegens, C Stals, LM
Citation: Vi. Dimitrov et al., Modeling of nitride layer formation during plasma nitriding of iron, COMP MAT SC, 15(1), 1999, pp. 22-34
Characteristic defects in CVD diamond: optical and electron paramagnetic resonance study
Authors: Nesladek, M Meykens, K Haenen, K Navratil, J Quaeyhaegens, C Stals, LM Stesmans, A Iakoubovskij, K Adriaenssens, GJ Rosa, J Vanecek, M
Citation: M. Nesladek et al., Characteristic defects in CVD diamond: optical and electron paramagnetic resonance study, DIAM RELAT, 8(8-9), 1999, pp. 1480-1484
Plasma diagnostics of triode ion-plating systems by energy-resolved mass spectroscopy and comparison of TiN film properties
Authors: Kadlec, S Macek, M Wouters, S Meert, B Navinsek, B Panjan, P Quaeyhaegens, C Stals, LM
Citation: S. Kadlec et al., Plasma diagnostics of triode ion-plating systems by energy-resolved mass spectroscopy and comparison of TiN film properties, SURF COAT, 119, 1999, pp. 1211-1218
Energy and mass spectroscopy studies during triode ion plating of TiN films in two different layouts
Authors: Macek, M Navinsek, B Panjan, P Kadlec, S Wouters, S Quaeyhaegens, C Stals, LM
Citation: M. Macek et al., Energy and mass spectroscopy studies during triode ion plating of TiN films in two different layouts, SURF COAT, 113(1-2), 1999, pp. 149-156
Correlation between the OES plasma composition and the diamond film properties during microwave PA-CVD with nitrogen addition
Authors: Vandevelde, T Wu, TD Quaeyhaegens, C Vlekken, J D'Olieslaeger, M Stals, L
Citation: T. Vandevelde et al., Correlation between the OES plasma composition and the diamond film properties during microwave PA-CVD with nitrogen addition, THIN SOL FI, 340(1-2), 1999, pp. 159-163
Low temperature photoconductivity detection of phosphorus in diamond
Authors: Haenen, K Meykens, K Nesladek, M Knuyt, G Quaeyhaegens, C Stals, LM Koizumi, S Gheeraert, E
Citation: K. Haenen et al., Low temperature photoconductivity detection of phosphorus in diamond, PHYS ST S-A, 174(1), 1999, pp. 53-58
High electrical resistivity of CVD-diamond
Authors: Manca, JV Nesladek, M Neelen, M Quaeyhaegens, C De Schepper, L De Ceuninck, W
Citation: Jv. Manca et al., High electrical resistivity of CVD-diamond, MICROEL REL, 39(2), 1999, pp. 269-273
Risultati: 1-8 |