AAAAAA

   
Results: 1-2 |
Results: 2
CHARACTERIZATION OF THE POLYSILICON THIN-FILM TRANSISTORS ELABORATED IN HIGH AND LOW-TEMPERATURE PROCESSES - STUDY OF THE DENSITY OF TRAPS
Authors: SEHIL H RAHMANI NM PICHON L MENEZLA R RAOULT F BENAMARA Z
Citation: H. Sehil et al., CHARACTERIZATION OF THE POLYSILICON THIN-FILM TRANSISTORS ELABORATED IN HIGH AND LOW-TEMPERATURE PROCESSES - STUDY OF THE DENSITY OF TRAPS, Synthetic metals, 90(3), 1997, pp. 181-185
THE ANALYSIS OF THE LEAKAGE CURRENT OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS AS A FUNCTION OF ACTIVE LAYER THICKNESS
Authors: SEHIL H RAHMANI NM RAOULT F
Citation: H. Sehil et al., THE ANALYSIS OF THE LEAKAGE CURRENT OF POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS AS A FUNCTION OF ACTIVE LAYER THICKNESS, Materials chemistry and physics, 42(2), 1995, pp. 101-105
Risultati: 1-2 |