Authors:
RAJASREE K
VIDYALAL V
RADHAKRISHNAN P
NAMPOORI VPN
VALLABHAN CPG
GEORGE AK
Citation: K. Rajasree et al., USE OF MIRAGE EFFECT FOR THE DETECTION OF PHASE-TRANSITIONS IN LIQUID-CRYSTALS, Materials letters, 36(1-4), 1998, pp. 76-80
Citation: V. Vidyalal et al., MEASUREMENTS OF ELECTROMAGNETIC SHIELDING EFFECT USING HTSC MATERIALS, Modern physics letters B, 10(7), 1996, pp. 293-297
Authors:
RAJASREE K
VIDYALAL V
RADHAKRISHNAN P
NAMPOORI VPN
VALLABHAN CPG
Citation: K. Rajasree et al., OPTICAL-FIBER-BASED POSITION-SENSITIVE DETECTOR FOR THERMOOPTIC DEFLECTION STUDIES, Optical engineering, 33(6), 1994, pp. 1869-1871
Authors:
RAJASREE K
RADHAKRISHNAN P
NAMPOORI VPN
VALLABHAN CPG
Citation: K. Rajasree et al., DETERMINATION OF THE LASER-INDUCED DAMAGE THRESHOLD OF BULK POLYMER SAMPLES AT 1.06-MU-M USING THE PULSED PHOTOTHERMAL DEFLECTION TECHNIQUE, Measurement science & technology, 4(5), 1993, pp. 591-595
Authors:
VIDYALAL V
RAJASREE K
VALLABHAN CPG
THOMAS PC
NAYAR VU
Citation: V. Vidyalal et al., ELECTRICAL AND MAGNETIC MEASUREMENTS IN K DOPED GDBA2CU3O7-D HIGH-TEMPERATURE SUPERCONDUCTORS, International journal of modern physics b, 7(18), 1993, pp. 3273-3279
Authors:
RAJASREE K
VIDYALAL V
RADHAKRISHNAN P
NAMPOORI VPN
VALLABHAN CPG
Citation: K. Rajasree et al., MEASUREMENT OF LASER-ABLATION THRESHOLD ON DOPED BISRCACUO HIGH-TEMPERATURE SUPERCONDUCTORS BY THE PULSED PHOTOTHERMAL DEFLECTION TECHNIQUE, Journal of applied physics, 74(3), 1993, pp. 2004-2007