Authors: BERTIN F CHABLI A CHIARIGLIONE E BURDIN M BERGER M BOUDET T LARTIGUE O RAVEL G

Citation: F. Bertin et al., SPECTROSCOPIC ELLIPSOMETRY WITH COMPENSATOR AND X-RAY SPECULAR REFLECTIVITY FOR CHARACTERIZATION OF THIN OPTICAL-LAYERS ON TRANSPARENT SUBSTRATES, Thin solid films, 313, 1998, pp. 68-72