Authors: EASWARAKHANTHAN T RAVELET S

Citation: T. Easwarakhanthan et S. Ravelet, NUMERICAL CALIBRATION OF THE ANGLE OF INCIDENCE IN ELLIPSOMETERS, Measurement science & technology, 7(5), 1996, pp. 768-775

Authors: EASWARAKHANTHAN T RAVELET S RENARD P

Citation: T. Easwarakhanthan et al., AN ELLIPSOMETRIC PROCEDURE FOR THE CHARACTERIZATION OF VERY THIN SURFACE-FILMS ON ABSORBING SUBSTRATES, Applied surface science, 90(2), 1995, pp. 251-259

Authors: BATH A AHAITOUF A LEPLEY B BELMAHI M REMY M RAVELET S

Citation: A. Bath et al., PHOTOLUMINESCENCE CHARACTERIZATION OF STRUCTURES OBTAINED BY MULTIPOLAR PLASMA OXIDATION OF INP, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 148-152

Authors: RENARD P RAVELET S SIMON C BOUZIANE A LEPLEY B

Citation: P. Renard et al., TRANSPORT PROCESSES IN AU N-INP AND AU/OXIDE/N-INP DEVICES TREATED INOXYGEN MULTIPOLAR PLASMA/, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 157-161