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Results: 1-6 |
Results: 6

Authors: ANTONOV VN JEPSEN O HENRION W REBIEN M STAUSS P LANGE H
Citation: Vn. Antonov et al., ELECTRONIC-STRUCTURE AND OPTICAL-PROPERTIES OF BETA-FESI2, Physical review. B, Condensed matter, 57(15), 1998, pp. 8934-8938

Authors: HENRION W REBIEN M ANTONOV VN JEPSEN O LANGE H
Citation: W. Henrion et al., OPTICAL CHARACTERIZATION OF RU2SI3 BY SPECTROSCOPIC ELLIPSOMETRY, UV-VIS-NIR SPECTROSCOPY AND BAND-STRUCTURE CALCULATIONS, Thin solid films, 313, 1998, pp. 218-221

Authors: ANGERMANN H HENRION W REBIEN M FISCHER D ZETTLER JT ROSELER A
Citation: H. Angermann et al., H-TERMINATED SILICON - SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS CORRELATED TO THE SURFACE ELECTRONIC-PROPERTIES, Thin solid films, 313, 1998, pp. 552-556

Authors: FILONOV AB MIGAS DB SHAPOSHNIKOV VL BORISENKO VE HENRION W REBIEN M STAUSS P LANGE H BEHR G
Citation: Ab. Filonov et al., THEORETICAL AND EXPERIMENTAL-STUDY OF INTERBAND OPTICAL-TRANSITIONS IN SEMICONDUCTING IRON DISILICIDE, Journal of applied physics, 83(8), 1998, pp. 4410-4414

Authors: ANGERMANN H HENRION W REBIEN M KLIEFOTH K FISCHER D ZETTLER JT
Citation: H. Angermann et al., EVOLUTION OF ELECTRONICALLY ACTIVE DEFECTS DURING THE FORMATION OF SISIO2 INTERFACE MONITORED BY COMBINED SURFACE PHOTOVOLTAGE AND SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS/, Microelectronic engineering, 36(1-4), 1997, pp. 43-46

Authors: ANGERMANN H HENRION W REBIEN M ZETTLER JT ROSELER A
Citation: H. Angermann et al., CHARACTERIZATION OF CHEMICALLY PREPARED SI-SURFACES BY UV-VIS AND IR SPECTROSCOPIC ELLIPSOMETRY AND SURFACE PHOTOVOLTAGE, Surface science, 388(1-3), 1997, pp. 15-23
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