Authors: KELSON I LEVY Y RACAH D REDMARD E BEAUDOIN M PINNINGTON T TIEDJE T GIESEN U

Citation: I. Kelson et al., THE APPLICABILITY OF IMPLANTED ALPHA-SOURCES TO THICKNESS AND STOICHIOMETRY MEASUREMENTS OF THIN-FILMS, Journal of physics. D, Applied physics, 30(1), 1997, pp. 131-136

Authors: KELSON I LEVY Y REDMARD E

Citation: I. Kelson et al., RECOIL IMPLANTATION OF ALPHA-SOURCES FOR THICKNESS MEASUREMENT OF THIN-FILMS, Journal of physics. D, Applied physics, 28(1), 1995, pp. 100-104